Chiudi

Aggiungi l'articolo in

Chiudi
Aggiunto

L’articolo è stato aggiunto alla lista dei desideri

Chiudi

Crea nuova lista

Offerta imperdibile
Research Perspectives and Case Studies in System Test and Diagnosis - cover
Research Perspectives and Case Studies in System Test and Diagnosis - cover
Dati e Statistiche
Wishlist Salvato in 0 liste dei desideri
Research Perspectives and Case Studies in System Test and Diagnosis
Attualmente non disponibile
148,04 €
-6% 157,49 €
148,04 € 157,49 € -6%
Attualmente non disp.
Chiudi

Altre offerte vendute e spedite dai nostri venditori

Altri venditori
Prezzo e spese di spedizione
ibs
Spedizione Gratis
-6% 157,49 € 148,04 €
Altri venditori
Prezzo e spese di spedizione
ibs
Spedizione Gratis
-6% 157,49 € 148,04 €
Altri venditori
Prezzo e spese di spedizione
Chiudi
ibs
Chiudi

Tutti i formati ed edizioni

Chiudi
Research Perspectives and Case Studies in System Test and Diagnosis - cover
Chiudi

Promo attive (0)

Descrizione


"System level testing is becoming increasingly important. It is driven by the incessant march of complexity ... which is forcing us to renew our thinking on the processes and procedures that we apply to test and diagnosis of systems. In fact, the complexity defines the system itself which, for our purposes, is ?any aggregation of related elements that together form an entity of sufficient complexity for which it is impractical to treat all of the elements at the lowest level of detail . System approaches embody the partitioning of problems into smaller inter-related subsystems that will be solved together. Thus, words like hierarchical, dependence, inference, model, and partitioning are frequent throughout this text. Each of the authors deals with the complexity issue in a similar fashion, but the real value in a collected work such as this is in the subtle differences that may lead to synthesized approaches that allow even more progress. The works included in this volume are an outgrowth of the 2nd International Workshop on System Test and Diagnosis held in Alexandria, Virginia in April 1998. The first such workshop was held in Freiburg, Germany, six years earlier. In the current workshop nearly 50 experts from around the world struggled over issues concerning the subject... In this volume, a select group of workshop participants was invited to provide a chapter that expanded their workshop presentations and incorporated their workshop interactions... While we have attempted to present the work as one volume and requested some revision to the work, the content of the individual chapters was not edited significantly. Consequently, you will see different approaches to solving the same problems and occasional disagreement between authors as to definitions or the importance of factors. ... The works collected in this volume represent the state-of-the-art in system test and diagnosis, and the authors are at the leading edge of that science...". From the Preface
Leggi di più Leggi di meno

Dettagli

Frontiers in Electronic Testing
1998
Hardback
232 p.
Testo in English
235 x 155 mm
1170 gr.
9780792382638
Chiudi
Aggiunto

L'articolo è stato aggiunto al carrello

Chiudi

Aggiungi l'articolo in

Chiudi
Aggiunto

L’articolo è stato aggiunto alla lista dei desideri

Chiudi

Crea nuova lista

Chiudi

Chiudi

Siamo spiacenti si è verificato un errore imprevisto, la preghiamo di riprovare.

Chiudi

Verrai avvisato via email sulle novità di Nome Autore